TA2 Facility 21 – OU NanoSIMS 50L
Average visit: 5 days
NanoSIMS 50L is the latest generation of Secondary Ion Mass Spectrometer (Ion Microprobe) instrumentation, allowing high sensitivity compositional analyses of up to 7 species (elements, molecules or isotopes) simultaneously with high spatial resolution and high mass resolution.
The instrument has two primary ion beam sources (oxygen and cesium) for both negative (non-metal) and positive (metal) ions. It is equipped with a secondary electron detector and 7 adjustable electron multipliers for high speed and high sensitivity detection, three of which can be swapped for Faraday Cups for high precision measurements.
The instrument is capable of per mil precision stable isotope ratio measurements for a wide range of elements (e.g. H, Li, B, C, N, O, Mg, S, Cl, etc) and element detection down to ppm levels on spots a few microns across as well as high resolution isotope ratio and element mapping with a spatial resolution down to ~100 nm.
Ian Franchi, School of Physical Sciences, The Open University, Walton Hall, Milton Keynes, MK7 6AA, UK. firstname.lastname@example.org
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