TA2 Facility 33 – High Voltage Electron Microscope (South Korea)
Average visit: 7 Days (16hr + 3 Focused Ion Beams)
Features:
- Accelerating voltage: 1,250 kV
- Point resolution: 0.12 nm
- Specimen tilt angle: α = ±60°, β = ±45°
- Post column type Gatan Image Filter
- Analytical functionality
(1) 3D atomic resolution with high tilting capability
(2) EELS & EF-TEM imaging (HV-GIF system)
(3) in-situ TEM analysis (heating, irradiation, straining, & cooling)
(4) 3D tomography
Application:
- Analysis of the atomic structure of novel materials
- Electronic structure and chemical analysis (HV-EELS)
- In-situ cooling (-165℃), heating (Double (∼900℃) & single tilt (∼1300℃) heating holder), irradiation, and straining TEM study
- Direct observation of phase transition of nanostructured materials
- 3D electron tomography of nanostructured material
Contact:
Dr. Keewook Yi, KBSI
Email: kyi[at]kbsi.re.kr
Website: WOLF portal information
TA2 Facility 33 – High Voltage Electron Microscope. Credit: Korea Basic Science Institute (KBSI)
Credit: Korea Basic Science Institute (KBSI)
Credit: Korea Basic Science Institute (KBSI)
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