TA2 Facility 34 – Atomic Level Electronic Structure STEM (South Korea)
Average visit: 7 days (16hr + 3 Focused Ion Beams)
Features:
- Monochromator system (30 – 200kV)
- Probe Corrector (ASCOR 5th corrector)
- EDX system (Jeol dual SDD system)
- EELS system (1st Gatan Continuum – CMOS)
- STEM detector (HAADF, BF, ABF, e-ABF)
- Camera system (OneView 4k x 4k camera)
- Resolution (in STEM): 0.136 nm at 30 kV, 0.08 nm ay 200 kV
- Energy Resolution: < 25 meV at 60 kV, < 36 meV at 200 kV
Application:
- Chemical analysis
- Structure and defects analysis
- Imaging analysis in variable conditions
- High angle annular dark field imaging
Contact:
Dr. Keewook Yi, KBSI
Email: kyi[at]kbsi.re.kr
Website: WOLF portal information
TA2 Facility 34 – Atomic Level Electronic Structure STEM. Credit: KBSI.
Credit: Korea Basic Science Institute (KBSI).
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